ELECTRONICS X-RAY INSPECTION

Find hidden defects before they reach the customer

2D, 2.5D and CT inspection for PCB, BGA, semiconductors, connectors and electronic assemblies — from lab to SMT line.

Encontre defeitos escondidos antes que cheguem ao cliente
Non-destructive inspectionSee inside without cutting the part
From R&D to productionManual, automated and inline configurations
Nikon + UnicompBreadth of ranges and applications
Specialist NM3D supportSelection, installation, training and after-sales

X-RAY RANGE FOR ELECTRONICS

From manual analysis to inline inspection

Nikon and Unicomp solutions for solder defects, voids, misaligned components, BGA, chips and reel counting.

Nikon brings premium imaging and advanced CT; Unicomp covers a broad range of offline, inline and X-ray counting systems.
PDF — XT V 130C
Watch video — XT V 130C
PDF — XT V 160
Watch video — XT V 160
PDF — AX 7900
Watch video — AX 7900
PDF — AX 8200 MAX
Watch video — AX 8200 MAX
AX 8300 S / Si
Unicomp

AX 8300 S / Si

High-magnification platform for detailed PCBA and semiconductor inspection.

MicrofocusPCBA
PDF — AX 8300 S / Si
AX 8800 E
Unicomp

AX 8800 E

Advanced inspection with flexible manipulation for larger samples and assemblies.

FlexibleElectronics
PDF — AX 8800 E
PDF — AX 9100 / MAX / VS
Watch video — AX 9100 / MAX / VS
PDF — AX 9500
Watch video — AX 9500
PDF — CX 3000
Watch video — CX 3000
PDF — CX 7000 L
Watch video — CX 7000 L
LX 2000
Unicomp

LX 2000

Inline X-ray inspection for automated production component control.

Inline100% inspection
PDF — LX 2000
PDF — LX 9200
Watch video — LX 9200
AX 8500
Unicomp

AX 8500

110 kV X-ray for leadframes, semiconductors, power electronics and high-precision inspection.

110 kVLeadframe
AX 8300 MAX
Unicomp

AX 8300 MAX

Inspection of MOSFET, ceramics, BGA and PCBA with advanced void and crack visualisation.

MOSFETIHDR

FROM IMAGE TO DECISION

Capabilities for high-density electronics

PCB Analysis Suite

Automated BGA, wire-bond, PTH and PoP measurement with pass/fail decisions.

Oblique angle and 360° rotation

Keep the region of interest in view even at high magnification.

High Contrast Filter

Reveal high- and low-contrast detail simultaneously.

Sample protection

Collision avoidance, low dose and ESD options for sensitive devices.

APPLICATION-LED SELECTION

Compare by board size, resolution and throughput

  • Part and material
    Size, density and geometry
  • Critical defect
    Voids, cracks, soldering or assembly
  • Resolution and penetration
    The right source, power and detector
  • Throughput and automation
    Laboratory, at-line or inline

You do not have to choose alone

Send us the part, the defect you need to detect and the inspection rate. NM3D will recommend the right technology, source, detector and software.

Request a recommendation

Validate a sample before deciding

Send us a board or component and the target defect so we can define the most effective configuration.

Request a demo or quote