Nikon's adaptive microfocus CT systems, distributed by NM3D Ibérica, provide high-resolution inspection of components ranging from small plastic connectors to aluminum castings. These systems are ideal for research and development activities, failure analysis and quality control in a production environment.
Adaptable solutions for demanding inspection applications
The XT H line combines the flexibility needed in the laboratory with advanced features such as 225 kV Rotating.Target 2.0, Half.Turn CT acquisition mode and Auto.Filament Control. These technologies contribute to shorter cycle times and higher system availability, especially in serial inspection contexts on the shop floor.
Product Highlights
Operational flexibility - Thanks to the possibility to choose between different sources, targets, CT scanning strategies and options such as motorized adjustment of the distance between the source and the detector, XT H systems are extremely versatile, effectively responding to a wide range of inspection requirements.
X.Tend Helical CT - Allows scanning of tall objects in a single continuous acquisition, eliminating artifacts typical of cone beam and stitching of multiple scans. This approach also offers the advantage of performing inspections at higher magnifications, resulting in significantly higher resolutions.
225 kV Rotating.Target 2.0 - This unique technology enables continuous operation at up to 450 W, with up to three times the resolution for the same power — or three times faster acquisition times for equivalent resolution.
Operational flexibility
X.Tend Helical CT
225 kV Rotating.Target 2.0
Main Features
Feature | Description |
Dual.Material CT for production |
Innovative reconstruction technique for automatic inspection of dual-material samples, with significant reduction of density artifacts. |
OPC UA Production Integration | Allows direct connection to MES (Manufacturing Execution Systems), facilitating integration into the production environment. |
Auto.Filament Control |
Intelligent X-ray source control system that doubles filament life without compromising image resolution. |
Half.Turn CT |
Optimized reconstruction algorithms, developed in-house, that allow to reduce the acquisition time by half without losing quality. |
X.Tend Helical CT |
Continuous scanning of tall objects with elimination of stitching artifacts and increased resolution by moving the sample closer to the source. |
Offset.CT |
It allows scanning components with dimensions larger than the detector, maintaining high resolution and proximity to the X-ray source. |
Traceable measurement accuracy |
The MCT225 system meets the requirements of the VDI/VDE 2630 standard, with MPE verification, ensuring the required metrological accuracy. |
Industry-leading image quality |
Flat panel detectors with high resolution (small pixel size) and microfocus sources with reduced focal spot for excellent images. |
Technical Specifications
XT H 225 For inspection of small to medium parts | XT H 225 ST 2x Flexible system for a variety of applications | MCT225 High accuracy X-ray CT metrology | |
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Support from NM3D Ibérica
XT H Series systems stand out for their flexibility, high resolution and ability to integrate into demanding industrial environments. The combination of cutting-edge hardware and advanced algorithms makes this technology especially suitable for companies seeking dimensional traceability, rigorous quality control and optimization of their production processes.
NM3D Ibérica provides specialized technical support, from the needs analysis phase to implementation and after-sales support. With a highly qualified team and vast experience in industrial metrology, we guarantee close monitoring and solutions tailored to the reality of each client.
If you would like to learn more about the potential of industrial CT tomography or have any technical questions, please do not hesitate to contact us.
Contact us
Email: sac@nm3diberica.com